Circuit Inspection
| Inspection Condition | (+) Probe | (-) Probe | Specification | ||
|---|---|---|---|---|---|
| Connector | Terminal | Connector | Terminal | ||
|
Cluster harness connector | 39/40 (power) | Chassis ground | - | Battery voltage |
|
Cluster harness connector | 1/37 (ground) | Chassis ground | - | Approx. below 1Ω |
|
PCM (component side) | 77 (P-CAN high) | Chassis ground | - | Figure |
| PCM (component side) | 60 (P-CAN low) | ||||
| Cluster harness connector | 32 (C-CAN high) | Chassis ground | - | Figure | |
| Cluster harness connector | 33 (C-CAN low) | Chassis ground | - | ||
|
PCM harness connector | 77 (P-CAN high) | ICU harness connector | 12 (P-CAN high) | Approx. below 1Ω |
| PCM harness connector | 60 (P-CAN low) | ICU harness connector | 11 (P-CAN low) | ||
|
Cluster harness connector | 32 (C-CAN high) | ICU harness connector | 9 (C-CAN high) | Approx. below 1Ω |
| Cluster harness connector | 33 (C-CAN low) | ICU harness connector | 10 (C-CAN low) | ||
|
Cluster harness connector | 32 (C-CAN high) | Cluster harness connector | 33 (C-CAN low) | Approx. 60Ω |
|
ICU (component side) | 9 (C-CAN high) | ICU (component side) | 10 (C-CAN low) | Approx. 120Ω |
| Cluster (component side) | 32 (C-CAN high) | Cluster (component side) | 33 (C-CAN low) | Approx. 120Ω | |
Good
- Fault is intermittent caused by poor contact in the sensor's and/or PCM's connector or was repaired and PCM memory was not cleared. Thoroughly check connectors for looseness, poor connection, bending, corrosion, contamination, deterioration, or damage. Repair or replace as necessary and go to "VERIFICATION OF REPAIR " procedure.
No Good
- Repair or replace as necessary and then, go to "VERIFICATION OF REPAIR " procedure.