Circuit Inspection
| Inspection Condition | (+) Probe | (-) Probe | Reference | ||
|---|---|---|---|---|---|
| Connector | Terminal | Connector | Terminal | ||
|
Data link connector | 3 (High) | Chassis ground | - | figure below. |
| Data link connector | 11 (Low) | Chassis ground | - | ||
|
Data link connector | 3 (High) | Data link connector | 11 (Low) | approx. 60Ω |
|
ECM/PCM (Component Side) | 85/60 (High) | ECM/PCM (Component Side) | 63/ 77 (Low) | About 120 Ω |
| Cluster (Component Side) | 32 (High) | Cluster (Component Side) | 33 (Low) | About 120 Ω | |
|
Data link connector | 3 (High) | Chassis ground | - | 0V |
| Data link connector | 11 (Low) | Chassis ground | - | 0V | |
|
Data link connector | 3 (High) | Chassis ground | - | (Infinite)Ω |
| Data link connector | 11 (Low) | Chassis ground | - | (Infinite)Ω | |
Good
- Go to "FPCM circuit inspection" procedure.
No Good
- Repair as necessary and go to "Verification of Repair " procedure.
| Inspection Condition | (+) Probe | (-) Probe | Reference | ||
|---|---|---|---|---|---|
| Connector | Terminal | Connector | Terminal | ||
|
FPCM connector | 10 (power) | Chassis ground | - | B+ |
| FPCM connector | 4 (ground) | Chassis ground | - | 0V | |
Good
- Fault is intermittent caused by poor contact in the sensor's and/or ECM/PCM's connector or was repaired and ECM/PCM memory was not cleared. Thoroughly check connectors for looseness, poor connection, bending, corrosion, contamination, deterioration, or damage. Repair or replace as necessary and go to "Verification of Repair " procedure.
No Good
- If no problems were found with the circuits or connectors, replace the Cluster or ECM/PCM and go to "Verification of Repair " procedure.